5120A and 5125A Phase noise and Allen deviation test sets

One Box Solution – The innovative 5120A combines sophisticated timing technologies into a single advanced instrument, which integrates all required measurement functionality into a one box solution, requiring no calibration or configuration

Phase noise and Allen deviation test sets, Microsemi

Easier, More Accurate and More Cost-Effective Measurements in One Box
The all-digital 5120A High-Performance Phase Noise and Allan Deviation (ADEV) Test Set with Ultra Low Noise Floor transforms the way accurate phase noise and Allan deviation measurements are made. This simple one-box solution makes fast yet accurate single sideband (SSB) phase noise and ADEV measurements at the click of a button, all at a fraction of the cost of alternative solutions. What used to be complicated and costly are now easier, more accurate, and more cost effective.

The 5120A leverages the extensive knowledge and experience obtained by Microsemi during the development of the industry standard for ADEV measurements, the 5110A. With a frequency range of 1 - 30MHz, the next generation 5120A also provides phase noise measurement accuracy down to previously impossible levels of ±1.0 dB.