3120A, Phase noise test probe, Microsemi

Microchip (Microsemi) 3120A High performance phase noise test probe

The programmable high-performance Microchip (Microsemi) 3120A Phase Noise Test Probe measures the amplitude, phase, and frequency stability of RF sources and two-port devices at frequencies from 0.5 MHz to 30 MHz More
Phase noise and Allen deviation test sets, Microsemi

5120A and 5125A Phase noise and Allen deviation test sets

One Box Solution – The innovative 5120A combines sophisticated timing technologies into a single advanced instrument, which integrates all required measurement functionality into a one box solution, requiring no calibration or configuration More

Microsemi, digital test sets

Phase noise measurements – Product list

Microchip (Microsemi’s) digital, state-of-the-art test sets bring a paradigm shift to the way that phase noise and ADEV measurements are made – Phase noise measurements More