Microchip (Microsemi) 3120A High performance phase noise test probe
The programmable high-performance Microchip (Microsemi) 3120A Phase Noise Test Probe measures the amplitude, phase, and frequency stability of RF sources and two-port devices at frequencies from 0.5 MHz to 30 MHz More
5120A and 5125A Phase noise and Allen deviation test sets
One Box Solution – The innovative 5120A combines sophisticated timing technologies into a single advanced instrument, which integrates all required measurement functionality into a one box solution, requiring no calibration or configuration More
Phase noise measurements – Product list
Microchip (Microsemi’s) digital, state-of-the-art test sets bring a paradigm shift to the way that phase noise and ADEV measurements are made – Phase noise measurements More